Transmission Electron Microscopy (TEM)
Transmission Electron Microscopy (TEM) is a microscopy technique in which a beam of electrons is transmitted through a specimen to form an image.
Available instrument: JEOL – JEM – 2100 High Resolution Transmission Electron Microscope and EDAX Ametek Energy Dispersive Spectroscopy with TEAM EDX software.
Sample acceptance and analysis
Particle size should be < 50 nm for high resolution imaging.
Samples containing Fe won’t be accepted.
| Sample Type | Sample Quantity Required |
|---|---|
Dispersion |
1 – 2 mL |
Powder |
0.1 – 0.5 g sample and
20 mL of the solvent used to make the dispersion. |
Since further dilutions may be required, 5-10 ml of the pure solvent used to make the dispersion will also be required with the sample.
TEM Imaging – Only 10 images will be provided.
TEM/EDX – 10 images and 2 EDX maps will be provided.
Scanning Electron Microscopy (SEM)
A Scanning Electron Microscope (SEM) is a type of electron microscope that produces images of a sample by scanning the surface with a focused beam of electrons
Available instrument: Hitachi SU6600 FE-SEM (Field Emission Scanning Electron Microscope) and Oxford instruments EDX with AZtec software.
Sample acceptance and analysis
| Sample Type | Sample Quantity Required |
|---|---|
Thin Film |
Maximum 1x1cm |
Powder |
About 50 mg |
Solid sample |
Maximum 0.5 x1x1 cm |
Dispersion |
0.5 mL concentrated dipersion |
Since further dilutions may be required for dispersion or if dispersion needs to be prepared from the powder sample, 5-10 ml of the pure solvent used to make the dispersion will also be required with the sample.
Samples should be free from moisture (except dispersions) and shouldn’t show magnetic properties (should not contain high quantities of Fe)
EDX – Suitable for qualitative analyses.
This technique produces low detection sensitivity for the elements below Sodium (Na) in the periodic table and is not sensitive to elements present in ppb/ ppm level.
SEM imaging – Only 6 images will be provided.
SEM/EDX – 6 images and 2 EDX maps will be provided.
Atomic Force Microscopy (AFM)
The AFM is capable of obtaining measurements from conductors, non-conductors as well as some liquids without delicate sample preparation.
Available instrument: Park Systems XE 100 Atomic Force Microscope
Sample acceptance and analysis
Scan area 10 x 10 µm
Only non-contact mode is available
The solvent to be used should be recommended by the customer.
| Sample Type | Sample Quantity Required | Solvent Volume Required |
|---|---|---|
Dispersion |
5 mL |
5 – 10 mL pure solvent used to make the dispersion in case of further dilutions |
Powder |
50 mg |
10 mL to make the dispersion |
