SLINTEC Building Structure 1500x110-04

Imaging

Transmission Electron Microscopy (TEM)

Transmission Electron Microscopy (TEM) is a microscopy technique in which a beam of electrons is transmitted through a specimen to form an image.

 

 

Available instrument:  JEOL – JEM – 2100 High Resolution Transmission Electron Microscope and EDAX Ametek Energy Dispersive Spectroscopy with TEAM EDX software.

Sample acceptance and analysis

Particle size should be < 50 nm for high resolution imaging.

Samples containing Fe won’t be accepted.

Sample Type Sample Quantity Required
Dispersion
1 – 2 mL
Powder
0.1 – 0.5 g sample and 20 mL of the solvent used to make the dispersion.

Since further dilutions may be required, 5-10 ml of the pure solvent used to make the dispersion will also be required with the sample.

 

TEM Imaging – Only 10 images will be provided.

TEM/EDX – 10 images and 2 EDX maps will be provided.

Scanning Electron Microscopy (SEM)

A Scanning Electron Microscope (SEM) is a type of electron microscope that produces images of a sample by scanning the surface with a focused beam of electrons

Available instrument: Hitachi SU6600 FE-SEM (Field Emission Scanning Electron Microscope) and Oxford instruments EDX with AZtec software.

Sample acceptance and analysis

Sample Type Sample Quantity Required
Thin Film
Maximum 1x1cm
Powder
About 50 mg
Solid sample
Maximum 0.5 x1x1 cm
Dispersion
0.5 mL concentrated dipersion

Since further dilutions may be required for dispersion or if dispersion needs to be prepared from the powder sample, 5-10 ml of the pure solvent used to make the dispersion will also be required with the sample.


Samples should be free from moisture (except dispersions) and shouldn’t show magnetic properties (should not contain high quantities of Fe)
EDX – Suitable for qualitative analyses.

This technique produces low detection sensitivity for the elements below Sodium (Na) in the periodic table and is not sensitive to elements present in ppb/ ppm level.

SEM imaging – Only 6 images will be provided.
SEM/EDX – 6 images and 2 EDX maps will be provided.

Atomic Force Microscopy (AFM)

The AFM is capable of obtaining measurements from conductors, non-conductors as well as some liquids without delicate sample preparation.

Available instrument: Park Systems XE 100 Atomic Force Microscope

Sample acceptance and analysis

Scan area 10 x 10 µm

Only non-contact mode is available

The solvent to be used should be recommended by the customer.

Sample Type Sample Quantity Required Solvent Volume Required
Dispersion
5 mL
5 – 10 mL pure solvent used to make the dispersion in case of further dilutions
Powder
50 mg
10 mL to make the dispersion